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White Paper: PXI-Based, Advanced Switching Architecture for Functional Test

This white paper describes the advantages of leveraging the 6U PXI architecture and employing advanced si...

Solution Spotlight: Expanding Digital Test Capabilities with a Multi-Site Test Feature

Test engineers are constantly challenged to do more with their test resources. One method to improve over...

Solution Spotlight: Field and Flightline Testing of MIL-STD-1760 Systems

Marvin Test Solutions' SmartCan is a universal flightline armament test set capable of testing both legac...

TS-321 Series

GENASYS High Performance Mixed Signal Test System Platform

GX3788

High-Performance, FPGA Multi-Function PXI Card

TS-960 Series

PXI Semiconductor Test System with Timing per Pin Digital Subsystem

TS-323 Series

GENASYS High Performance Mixed Signal Test System Platform