Test Solutions

Aircraft

Weapons Systems

AIM-9 Sidewinder

Maintenance Levels

Aerospace Test System
TS-321 Series

Automotive Test System
TS-322 Series

Satellite Test System
TS-323 Series

Core Test System TS-705	Base Analog/Digital Core Test System TS-710
Core Test System with Boundary Scan TS-720	Mixed Signal Test System TS-730
Digital Test System TS-750	Commercial Avionics Test System TS-770
Military Avionics Test System TS-775

GENASYS

High Performance Mixed Signal Test Platform

GENASYS Benchtop

Compact / Portable Test Platform

5G mmWave Production Test Platform TS-900e-5G Series	RF, Analog, and Digital Upgrade/Expansion MTEK Series	Integrated Semiconductor Test Platform TS-900 Series	Integrated Semiconductor Test Platform with Timing per Pin TS-960 Series	Integrated Semiconductor Test Platform with Timing per Pin TS-960e Series
GENASYS Semi Semiconductor Test Platform

Aerospace Test System
TS-321 Series

Automotive Test System
TS-322 Series

Satellite Test System
TS-323 Series

Core Test System TS-705	Base Analog/Digital Core Test System TS-710
Core Test System with Boundary Scan TS-720	Mixed Signal Test System TS-730
Digital Test System TS-750	Commercial Avionics Test System TS-770
Military Avionics Test System TS-775

GENASYS

High Performance Mixed Signal Test Platform

GENASYS Benchtop

Compact / Portable Test Platform

Rugged Field Test Set
MTS-207

SmartCan Universal Hand-held Test Set
MTS-3060C SmartCan

Portable PXI Chassis
GX7600

SmartCan Universal Armament Test Set 3060A SmartCan	Maverick Field Test Set MTS-206A
SmartCan - Maverick AGM-65 MTS-3060A AGM-65	Hellfire / Longbow Test Set AN-TSM-205
SmartCan - AMRAAM AIM-120 MTS-3060A AIM-120	Modular Target Simulator MTS-916
F-35 Armament Test Set MTS-235A	Laser Source Simulator MTS-1888
Common Armament Test Set MTS-209	Hellfire Missile Simulator MT3045

Rugged Field Test Set
MTS-207

Hellfire / Longbow Test Set
AN-TSM-205

Maverick Field Test Set
MTS-206A

Common Armament Test Set
MTS-209

F-35 Armament Test Set
MTS-235A

Commercial

Military

GENASYS Rugged

Adverse Environment Test Platform

Test Executive and IDE ATEasy	Digital I/O Vector Suite DIOEasy	Semiconductor Test Suite ICEasy
Waveform Analysis Suite WaveEasy	LASAR Development Suite DtifEasy	Calibration & Verification CalEasy

Products

Software ATEasy DIOEasy DtifEasy WaveEasy CalEasy ICEasy All Software Products	Chassis & Controllers Chassis Chassis Controllers and Bus Expanders All Chassis and Controllers Products	Digital I/O Dynamic Digital I/O Instrumentation Static Digital I/O Instrumentation Digital I/O Software and Training ROM Emulator Instrumentation JTAG / BDM Instrumentation All Digital I/O Products	Measurement Digital Multimeter Instrumentation Counter Timer Instrumentation Digitizer Instrumentation A/D Converters, Multi-function Instrumentation All Measurement Products	Stimuli Arbitrary Function Generators Standards Source Instrumentation Multi-function Instrumentation D/A Converters and Precision DC Source Instrumentation All Stimulus Products	FPGA Digital I/O Multi-Function All FPGA Products

Switching 3U PXI 6U PXI GENASYS Matrix Multiplexer RF High Current High Density General Purpose All Switching Products	SMUs & Power Supplies Power Supply Mainframe and Modules Instrumentation Precision DC Source Instrumentation All SMUs & Power Supplies Products	Bus Interfaces Bus Expanders GPIB MIL-STD-1553 ARINC 429 Comm All Bus Interfaces Products	GPIB Instrumentation Replacements Wavetek Replacements HP Replacements All GPIB Instrumentation Replacements Products	PXI Instruments Chassis and Controllers Digital I/O Measurement Stimuli FPGA Cards Switching Power Supplies Bus Interfaces All PXI Instruments Products	Legacy GTXI Chassis, Controllers and Instrumentation Digital I/O Stimuli Switching Power Supplies All Legacy Products	Military Missile Launchers All Military Products

Test Connections - March 2012

Home » News & Events » Newsletters

March 2012 - Newsletter

We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.

Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.

Automating Diagnostics and Repair with ATEasy and DSI International’s eXpress Software Tools

Automating the test and diagnosis of complex electronic assemblies is key to improving the productivity and efficiency of the overall test process. Read how DSI’s eXpress software and Geotest’s ATEasy have been integrated for the test and diagnosis of UUTs or view the two videos that demonstrate these tools in action.

Next Generation Test System Architectures for Depot and O-Level Test

For the U S Marine Corp, the need to maximize up time as well as minimize the repair loop for electronic assemblies is acute - resulting in the adoption of a maintenance / repair strategy that employs Depot – level test capabilities which can also be deployed at the field or O-level. This article, provides an overview of a paper presented at Autotestcon 2011 which discusses how the GX5960 digital subsystem can provide the basis for migrating from VXI to PXI for a next generation test system architecture, effectively addressing the on-going requirement for TPS migration, portability, performance and cost effective test solutions as well as addressing both Depot and O-level test needs.

Geotest Introduces CalEasy

Geotest has recently released a new software calibration / verification package, CalEasy for its PXI products - offering users the ability to verify and recalibrate Geotest instrumentation on-site.

Newsworthy Happenings

Geotest and our distributors hope to see you at one of the upcoming tradeshows during the months of March and April. Currently, Geotest and our distributors will be attending shows in Paris, Istanbul, Grenoble, and Torino. Continue reading for more details about tradeshows and other current news about Geotest and our distributors.

Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today! Download your 30 day FREE TRIAL!

All of Geotest’s digital I/O and FPGA instruments use the high density, 68 pin VHD connector. To simplify interfacing to this connector, Geotest offers two different interface boards.Read on to learn more.

Read the blog post here.

Geotest’s GX5295 features a Parametric Measurement Unit (PMU) per pin. The PMU feature can be used to perform a fast continuity and shorts/opens test.Click here to learn more.

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Can't find what you're looking for? We'll build it for you. We also customize and adapt standard catalog products to meet your specific needs. Click here to request more information.

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About Marvin Test Solutions

Marvin Test Solutions, a vertically-integrated aerospace test and measurement company, has created and delivered innovative, reliable test systems for factory, depot, intermediate, and flightline use since 1988. Our expertise delivering aerospace precision underpins our manufacturing solutions, enabling us to quickly meet customers’ requirements with high-performance products and custom turnkey systems, backed by excellent long-term customer support.

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888-837-8297 (toll-free)

949-263-2222 (local)

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Aircraft

Weapons Systems

Maintenance Levels

GENASYS

GENASYS Benchtop

GENASYS Semi

GENASYS

GENASYS Benchtop

Commercial

Military

GENASYS Rugged

Test Connections - March 2012

Automating Diagnostics and Repair with ATEasy and DSI International’s eXpress Software Tools

Next Generation Test System Architectures for Depot and O-Level Test

Geotest Introduces CalEasy

Newsworthy Happenings

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