New Product
TS-960e Series

Semiconductor Test System

  • High-performance digital, mixed-signal, and RF semiconductor test capabilities
  • Compact, single chassis footprint
  • Industry leading digital subsystem offers timing per pin architecture with sub-nanosecond edge placement & 64 time sets for no-compromise digital test capability
  • Available with Keysight Technologies’ comprehensive portfolio of PXIe RF instrumentation for addressing a wide range of RF & mmWave applications
  • Integrated platform includes ATEasy® test executive / test development software and comprehensive software tools for test development, debug, and file translation
  • Bench top and integrated manipulator configurations