User Programmable FPGA PXI Instrumentation for Functional Test – Applications and Best Practices
Field Programmable Gate Arrays are used extensively in today’s electronic assemblies and test engineers are also choosing to incorporate FPGA – based instrumentation as part of their functional test solutions.
This presentation will provide an overview of how user-programmable, FPGA-based PXI instrumentation, when combined with commercially available IP (Intellectual Property) or custom logic cores, can provide cost-effective, flexible test instrumentation solutions which can potentially support multiple applications and a range of interfaces using a single, FPGA-based instrument. In addition, the presentation will discuss “best practices” associated with the design and programming of FPGAs in order to ensure success and maintainability for a user – defined FPGA instrument.
Originally presented at PXI China 2018.
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