Geotest Presents the GX5280 Series of New 3U Digital I/O Cards
Geotest Presents the GX5280 Series of New 3U Digital I/O Cards
AUTOTESTCON (September 21, 2004) - Geotest-Marvin Test Systems, Inc., announces the addition of a family of 3U PXI high speed Digital I/O (DIO) cards - the GX5280 Series. The GX5280 Series are high performance, DRAM based cards with test rate of up to 100 MHz data rate and up to 32 I/O channels with selectable I/O levels of 1.5 V, 1.8 V, 2.5 V, 3.3 V or 5 V (TTL, LVTTL, CMOS, LVCMOS). The single board design supports both stand-alone or master/ slave functionality without the use of add-on modules. Up to seven slaves can be used with one master card.
The GX5280 Series offers up to 64 Mb memory depth per channel (256 MB total memory) with a memory access windowing method to limit required PCI memory space. Additional features include loop on break address and/or through a defined block of vector memory, Halt or Pause on break address, and a direct mode continuous data transfer between the system controller and I/O pins.
"Digital I/O products have always been one of Geotest's core technologies," said Lynn Murdock, Vice President of Sales and Marketing. "These new 3U Digital I/O cards now allow us to provide the high performance DIO products that we are known for to our customers utilizing 3U systems."
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About Geotest - A subsidiary of the Marvin Group (Inglewood, CA) Geotest
- Marvin Test Systems, Inc. is a global supplier of PXI and PC-based test products,
systems, and solutions. Geotest's products and systems are used worldwide in thousands
of aerospace, semiconductors, communications, medical, industrial, and military
test applications.