Geotest Releases ATEasy 8.0 with Multiple UUT Test Capability
Geotest Releases ATEasy 8.0 with Multiple UUT Test Capability
ATEasy 8.0 offers expanded test executive and test development features including parallel test capability, faster execution, and scripting language support
Irvine, Calif. (September 13, 2010) – Geotest today announced a new release of its Test Executive and Test Development Environment – ATEasy. ATEasy 8.0 features many additional capabilities and performance enhancements including testing of multiple UUTs, parallel and sequential test capability, up to 12x improvement in test execution speed, expanded test profile features and support for scripting languages including TCL, PERL, and SNMP.
“With the release of ATEasy 8.0, our customers will find that Geotest continues to offer the most feature rich and cost effective test executive and test development software suite in the industry,” said Ron Yazma , Geotest’s VP of software engineering. “8.0’s new features including parallel test allows users to more effectively develop and use test system resources without burdening them with the complexities normally associated with concurrent test architectures.”
ATEasy 8.0 is fully compatible with previous versions and supports a wide range of development environments including Visual BASIC, COM, C, .NET 4.0, and LabVIEW 2010. ATEasy is also compatible with the Windows 64-bit operating system, Windows XP, VISTA, Windows 2000 and Windows 98.
Availability:
Immediately from the Geotest website (www.geotestinc.com). ATEasy subscribers will start receiving their upgrade kit starting in mid-September.
For More Information:
Product information: www.geotestinc.com/Product.aspx?model=ATeasy
Local sales information: www.geotestinc.com/Company/FindRep.aspx
About Geotest - A subsidiary of the Marvin Group (Inglewood, CA) Geotest
- Marvin Test Systems, Inc. is a global supplier of PXI and PC-based test products,
systems, and solutions. Geotest's products and systems are used worldwide in thousands
of aerospace, semiconductors, communications, medical, industrial, and military
test applications.