Test Connections - October 2010 - Newsletter | Marvin Test Solutions, Inc.

October 2010 - Newsletter

We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.

Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.

Advanced Technology and PXI's Flexible Architecture Overcome the Design Challenges for High Performance Digital Subsystems

The implementation of high-performance PXI digital functional test subsystems has become a reality. But the smaller form factor of PXI also presents some unique challenges for designers. Learn more about these challenges and how Geotest is using advances in technology and the flexibility of the PXI platform to address them.

When Aircraft Sensors Fail: Improving the Accuracy and Effectiveness of Sensor Testing

Aircraft position sensor failure can cause expensive flight delays, cancelations, and turnbacks as well as passenger annoyances. With improved sensor testing through automated test techniques, aircraft maintenance personnel can troubleshoot and remediate these false readings and even predict future failures.

A New Release of ATEasy, Expanded PXI FPGA Product Line, and New Digital Test Instrumentation

At the upcoming Electronica conference in Munich, Germany on November 9-12, Geotest will be highlighting its newest release of ATEasy — ATEasy 8.0 as well as new PXI digital instrumentation and FPGA products.

Newsworthy Happenings

Read about the latest news and events from Geotest, at home and around the world.

Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today! Download your 30 day FREE TRIAL!

Q: Are you curious about how the PC finds and identfies all of the PCI and PXI modules installed in your test system? Learn how the PC's Basic Input/Output System (BIOS) is used to identify and configure a test system's modules.Read on to learn more.

Read the blog post here.

Want to learn about how to access and control an LXI instrument with ATEasy?Click here to learn more.

Would you like to receive the Test Connections Newsletters on a regular basis? You can sign up at any time.

Can't find what you're looking for? We'll build it for you. We also customize and adapt standard catalog products to meet your specific needs. Click here to request more information.

Software ATEasy DIOEasy DtifEasy WaveEasy CalEasy ICEasy All Software Products	Chassis & Controllers Chassis Chassis Controllers and Bus Expanders All Chassis and Controllers Products	Digital I/O Dynamic Digital I/O Instrumentation Static Digital I/O Instrumentation Digital I/O Software and Training ROM Emulator Instrumentation JTAG / BDM Instrumentation All Digital I/O Products	Measurement Digital Multimeter Instrumentation Counter Timer Instrumentation Digitizer Instrumentation A/D Converters, Multi-function Instrumentation All Measurement Products	Stimuli Arbitrary Function Generators Standards Source Instrumentation Multi-function Instrumentation D/A Converters and Precision DC Source Instrumentation All Stimulus Products	FPGA Digital I/O Multi-Function All FPGA Products

Switching 3U PXI 6U PXI GENASYS Matrix Multiplexer RF High Current High Density General Purpose All Switching Products	SMUs & Power Supplies Power Supply Mainframe and Modules Instrumentation Precision DC Source Instrumentation All SMUs & Power Supplies Products	Bus Interfaces Bus Expanders GPIB MIL-STD-1553 ARINC 429 Comm All Bus Interfaces Products	GPIB Instrumentation Replacements Wavetek Replacements HP Replacements All GPIB Instrumentation Replacements Products	PXI Instruments Chassis and Controllers Digital I/O Measurement Stimuli FPGA Cards Switching Power Supplies Bus Interfaces All PXI Instruments Products	Legacy GTXI Chassis, Controllers and Instrumentation Digital I/O Stimuli Switching Power Supplies All Legacy Products	Military Missile Launchers All Military Products

Your Name	Required
Your Email	Required
	(use commas to separate multiple email addresses)
To Email	Required
Subject	Required
Link
	Enter message in space below

Aircraft

Weapons Systems

Maintenance Levels

GENASYS

GENASYS Benchtop

GENASYS Semi

GENASYS

GENASYS Benchtop

Commercial

Military

GENASYS Rugged

Test Connections - October 2010

Advanced Technology and PXI's Flexible Architecture Overcome the Design Challenges for High Performance Digital Subsystems

When Aircraft Sensors Fail: Improving the Accuracy and Effectiveness of Sensor Testing

A New Release of ATEasy, Expanded PXI FPGA Product Line, and New Digital Test Instrumentation

Newsworthy Happenings

Enter message in space below

Product Lines

Resources

About Marvin Test Solutions

Contact Us

Aircraft

Weapons Systems

Maintenance Levels

GENASYS

GENASYS Benchtop

GENASYS Semi

GENASYS

GENASYS Benchtop

Commercial

Military

GENASYS Rugged

Test Connections - October 2010

Advanced Technology and PXI's Flexible Architecture Overcome the Design Challenges for High Performance Digital Subsystems

When Aircraft Sensors Fail: Improving the Accuracy and Effectiveness of Sensor Testing

A New Release of ATEasy, Expanded PXI FPGA Product Line, and New Digital Test Instrumentation

Newsworthy Happenings

Select Your Country

Email this Page

Enter message in space below

Product Lines

Resources

About Marvin Test Solutions

Contact Us