Welcome to our first newsletter of 2018 - a year that already promises to be filled with opportunities and growth.
Our active international trade show schedule now includes not only Paris and Farnborough, but also Dubai and Singapore. The addition of these two major regional defense shows has enabled us to better interact and serve our growing customer base.
We hope to see you at the Farnborough Airshow in July to discuss your test challenges and demonstrate how we can deliver solutions that meet and exceed your most demanding requirements. As always, you can count on MTS for innovative solutions that make test easy, and of course, our unrivaled long-term support.
We’re excited to announce that we will be part of the BAE Systems-led team for the U.S. Air Force’s Bomber Armament Tester program, and that MTS has been awarded a contract by the U.S. Air Force Ogden Air Logistics Complex at Hill AFB to provide chassis and instrumentation for the production of PATS-70A test sets used for O-Level and I-Level maintenance of A-10/C aircraft. You can learn more about both of these mission-critical programs in the “In the News” section of this newsletter.
Stephen T. Sargeant CEO
We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.
Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.
PXI-based Flightline Test Sets | | | PXI has proven to be a powerful and robust standard that is suitable for most Mil-Aero test applications. PXI-based testers are widely used today in engineering test stations, as production acceptance testers, and as environmental stress screening testers, as well as full-fledged Intermediate-Level and Depot-Level testers. | | Read more
Consolidating Test Resources for Avionics Production Test | | | The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. A common test platform and consolidation of test resources facilitates development and long-term support of complex, high-value assemblies. | | Read more
PXI Switching | | | Virtually all ATE systems employ a switching subsystem in order to route test system resources to multiple test points on the UUT. The challenge for any switching subsystem is multi-dimensional and involves many considerations / trade-offs including footprint, performance, flexibility, maintainability, and reliability.
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Register for the ATEasy® webinar to learn more about new features and capabilities.
ATEasy® 10 SP1 is now available. Read on
to learn more.
Synchronizing Resources for Multiple UUT Testing Click here
to learn more.
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