53 GHz VNA RF test performance
High-performance digital, mixed-signal, and RF semiconductor test capabilities
Intel® mini-PC featuring 11th Generation Core Processor
Hosts any two of the GT5150 I/O modules
Increase test rate to 100 MHz
Programmable levels and thresholds with tristate control
PECL to TTL and TTL to PECL
1' SCSI Cable
20 slots supporting one 6U or 3U (embedded or remote) PXI controller and 19 PXI or cPCI instruments (3U or 6U)
18 inch harness, 25 pin DSUB , male to male
Comprehensive suite of software tools for semiconductor test applications