High-performance digital, mixed-signal, and RF semiconductor test capabilities
Preconfigured, cost effective, functional test solutions for analog, digital, mixed signal and avionics applications
Intel® mini-PC featuring 11th Generation Core Processor
Supports automated calibration and verification of Marvin Test Solutions instrumentation
Imports, converts and executes IEEE-1445 compliant .tap files from a LASAR simulation for use with MTS digital hardware and digital functional test systems
Connector Interface for GT5xxx/GX5xxx/GC5xxx Products
Connector Interface for all 5xxx/35xx Products
Import and convert STIL digital vectors (IEEE-1450, Standard Test Interface Language files) to MTS digital vector format
High voltage pin electronics with per channel programmability & PMU pin
Calibration service for GX5961 and GX5964 digital I/O cards
20 slots supporting one 6U or 3U (embedded or remote) PXI controller and 19 PXI or cPCI instruments (3U or 6U)
Comprehensive suite of software tools for semiconductor test applications
