Commercial Newsletter - June 2024

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Revitalize Aging Semiconductor Test Systems


In the dynamic world of semiconductor testing, the Marvin Test Expansion Kit (MTEK) Series offers a game-changing solution to breathe new life into legacy Automatic Test Equipment (ATE) systems. The MTEK leverages modern instrumentation with advanced performance, providing a seamless integration path for both engineering and high-volume production installations.

The MTEK Series is built on the open architecture of PXI, offering flexibility and scalability to address a diverse range of test needs for packaged and wafer test applications. Its compact design simplifies mechanical integration with legacy test systems, ensuring a hassle-free upgrade process. MTEK connects to the legacy system as a peripheral instrument and outputs all test results to the host system’s data log seamlessly while reducing test time up to 80%.

MTEK smoothly integrates with legacy test platforms like Teradyne, LTX/Credence, Eagle, or Verigy installations, offering an upgrade path without the need for costly system replacements. Whether you need to add RF, analog, or dynamic digital capability to your existing ATE, MTEK provides a cost-effective solution to meet emerging test requirements, while ensuring that your test systems remain efficient and relevant in today's fast-paced industry.
MTEK