Knowledge Base - Ts 960

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Signal Switching Transparency in High Channel Count Test Systems

This paper will delve into the challenges associated with implementing signal transparency in complex, high channel-count switching subsystems.

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Showing 1 - 10 of 14 Items | 1 2 | View All
Q200357

Apr 12, 2024

SemiEasy Semiconductor Production Test User Interface and Features

SemiEasy is a drop-in user interface designed to provide common semiconductor test features without requiring extensive configuration. Read more...

  
Q200356

Oct 27, 2023

Multi-site Production Test Development in ATEasy

Enhancements to ATEasy and its software drivers include support for scalable test program development, test execution time optimization, and parallel test support with existing ATEasy test code. Read more...

  
Q200340

Feb 2, 2021

Multisite Digital Test System Design

The following article discusses the relative merits of two types of multi-site digital semiconductor test system designs. This article focuses on using GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...

  
Q200334

Jun 10, 2020

Digital I/O Hardware Handshaking Using GX5280/GX5290 Series

This article demonstrates how to use GX5280/GX5290 Series external events as hardware handshakes to control test pattern execution Read more...

  
Q200333

May 29, 2020

Appending Multiple Digital Test Patterns to Reduce Test Time

The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...

  
Q200330

Apr 3, 2020

Translating STIL, WGL, VCD, EVCD and Teradyne ATP files to DIO/DIO6x Files

DioEasy-FIT and GtDio6x-FIT (File Import Toolkit) allows test engineers to easily import STIL, WGL, VCD, EVCD simulation and Teradyne ATP files to DIO or DIO6x files which are used by MTS digital I/O cards. The FIT when coupled with Marvin’s DIOEasy/GTDIO6x vector development / waveform display tools brings a powerful desktop tool set for debugging and developing digital test vectors for all MTS digital instruments without hardware. This article describes how to use the FIT converter tool to convert files. Read more...

  
Q200283

Jul 2, 2015
White Paper

White Paper: PXI-Based, Functional Test Solutions for Legacy and Next Generation Test Requirements

For both legacy and next generation test requirements, the PXI architecture offers a robust set of capabilities for performance mixed-signal test applications. By combining the capabilities of a performance digital subsystem (GX5960) with the flexibility of the GX7016 switching subsystem, the GENASYS platform provides all of the capabilities needed to address both legacy and future test needs. And with the modularity of these subsystems, end users have the option to configure these systems with moderate to high pin counts and with a wide range of instrumentation. The GENASYS platform and its subsystems has wide applicability for both factory and depot applications – solving both the legacy and future test needs for high value, mission critical products. Read more...

  
Q200269

Nov 24, 2014
White Paper

White Paper: Addressing Legacy ATE System Requirements with PXI

An overview of how the PXI architecture, associated instrumentation and software can provide the basis for a modern functional test platform that can effectively support both legacy ATE functionality as well as future functional test needs. Read more...

  
Q200230

Feb 5, 2013

Using External Events with the GX5296 and GX5960 Products

This article demonstrates how to use external events to control test pattern execution Read more...

  
Q200224

May 7, 2012

PMU Functionality with the GX5960 Series

Overview of the PMU API Functions supported by the GX5960 Series Digital Subsystem Read more...

  
Showing 1 - 10 of 14 Items | 1 2 | View All