Description
LVDS I/O Module for GX5150, GX5152,and GX5153 digital I/O modules. Supports 32 differential LVDS channels.
Knowledge Base Articles pertaining to GX5960
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The following article discusses the relative merits of two types of multi-site digital semiconductor test system designs. This article focuses on using GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards.
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This article demonstrates how to use GX5280/GX5290 Series external events as hardware handshakes to control test pattern execution
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The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards.
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DioEasy-FIT and GtDio6x-FIT (File Import Toolkit) allows test engineers to easily import STIL, WGL, VCD, EVCD simulation and Teradyne ATP files to DIO or DIO6x files which are used by MTS digital I/O cards. The FIT when coupled with Marvin’s DIOEasy/GTDIO6x vector development / waveform display tools brings a powerful desktop tool set for debugging and developing digital test vectors for all MTS digital instruments without hardware. This article describes how to use the FIT converter tool to convert files.
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Q200283
Jul 2, 2015
White Paper
For both legacy and next generation test requirements, the PXI architecture offers a robust set of capabilities for performance mixed-signal test applications. By combining the capabilities of a performance digital subsystem (GX5960) with the flexibility of the GX7016 switching subsystem, the GENASYS platform provides all of the capabilities needed to address both legacy and future test needs. And with the modularity of these subsystems, end users have the option to configure these systems with moderate to high pin counts and with a wide range of instrumentation. The GENASYS platform and its subsystems has wide applicability for both factory and depot applications – solving both the legacy and future test needs for high value, mission critical products.
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This article describes ICEasy add-on module used for Semiconductor test using Marvin Test Solutions DIO boards with PMU
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This article demonstrates how to use external events to control test pattern execution
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Q200227
Mar 1, 2012
White Paper
This article discusses how PXI digital subsystems such as the GX5960 can provide the basis for creating next generation test architectures, successfullly addressing TPS migration (from a Teradyne M9 platform) as well as meeting portability, performance and cost objectives for both Depot and O-level test needs.
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Overview of the PMU API Functions supported by the GX5960 Series Digital Subsystem
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How to use Pattern Test Flags for Conditional Branching/Halting on Error and Recording Errors
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